Архив за 07 Окт 2010

Увеличение пропускной способности цифрового мультиметра

Опубликовано 07 Окт 2010 | Рубрика Agilent, Разное | Просмотров: 38

  • Название: Improving Digital Multimeter Throughput (Agilent, Measurements Tips, Volume 5, Number 1)
  • Тип документа: Measurements Tips
  • Язык: ENG
  • Формат: PDF
  • Размер: 595 КБ

Краткое описание:

Whether your electronic test is in a manufacturing, design validation, or R&D environment, reducing your test time translates to lower cost and shortened product development schedules, both of which are clear benefi ts. The vast majority of electronic tests involve using a digital multimeter (DMM) at one time or another. There are a variety of ways to reduce DMM measurement times to improve overall test throughput. Of course, test time improvements sometimes require compromises in other areas, but knowing the tradeoffs involved in throughput improvements and identifying what is important in your specifi c test situation will help you determine which tradeoffs make the most sense.

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Советы по выбору подходящего датчика температуры для вашего применения

Опубликовано 07 Окт 2010 | Рубрика Agilent, Разное | Просмотров: 45

  • Название: Hints for Selecting the Correct Temperature Sensor for Your Application (Agilent, Measurements Tips, Volume 1, Number 3)
  • Тип документа: Measurements Tips
  • Язык: ENG
  • Формат: PDF
  • Размер: 335 КБ

Краткое описание:

If you want to make reliable temperature measurements, you need to carefully select the right temperature sensor for your application. Understanding the advantages and disadvantages of temperature sensors will help you take the proper precautions when you set up a test. Thermocouples, thermistors, resistance temperature detectors (RTDs), and temperature ICs are the most common temperature sensors used in electronic test. This measurement brief compares operating ranges, accuracy, cost, stability, sensitivity and ease of use for these popular temperature sensors.

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